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Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources

Ting Guo, Jennifer Lien

Published , Published online: 29 May 2025 , doi: 10.37188/lam.2025.038

Nanoradian precision has been achieved in control of X-ray optics using feedback from optical interferometric measurements and real time adjustments of three mirrors in a simulated X-ray laser cavity in recent work reported by Koehlenbeck et al.

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ISSN 2689-9620 EISSN 2831-4093

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